Data Package for "Assessing the quality of Oxygen-Plasma focused ion beam (O-PFIB) etching on polypropylene surfaces using Secondary Electron Hyperspectral Imaging"
<p>Data Package for "Assessing the quality of Oxygen-Plasma focused ion beam (O-PFIB) etching on polypropylene surfaces using Secondary Electron Hyperspectral Imaging" https://doi.org/10.3390/polym15153247<br></p><p>Please read Article: https://doi.org/10.3390/polym15153247 to understand the data presented.</p><p><br></p><p><br></p>
Funding
SEE MORE MAKE MORE: Secondary Electron Energy Measurement Optimisation for Reliable Manufacturing of Key Materials
Engineering and Physical Sciences Research Council
Find out more...DTP 2020-2021 University of Sheffield
Engineering and Physical Sciences Research Council
Find out more...History
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