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Data Package for "Assessing the quality of Oxygen-Plasma focused ion beam (O-PFIB) etching on polypropylene surfaces using Secondary Electron Hyperspectral Imaging"

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posted on 2023-07-31, 14:01 authored by Nicholas FarrNicholas Farr

Data Package for "Assessing the quality of Oxygen-Plasma focused ion beam (O-PFIB) etching on polypropylene surfaces using Secondary Electron Hyperspectral Imaging" https://doi.org/10.3390/polym15153247

Please read Article: https://doi.org/10.3390/polym15153247 to understand the data presented.



Funding

SEE MORE MAKE MORE: Secondary Electron Energy Measurement Optimisation for Reliable Manufacturing of Key Materials

Engineering and Physical Sciences Research Council

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DTP 2020-2021 University of Sheffield

Engineering and Physical Sciences Research Council

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    Department of Materials Science and Engineering

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