Data for “Secondary electron hyperspectral imaging of carbons: New insights and good practice guide”

This repository contains the data package for the research paper titled "Secondary electron hyperspectral imaging of carbons: New insights and good practice guide".

Contact: SM3 (SEE MORE MAKE MORE) project PI, Professor Cornelia Rodenburg, c.rodenburg@sheffield.ac.uk.

Acknowledgements:

JFN and SC acknowledge support from the Faraday Institution through project FutureCat (FIRG017).

JFN acknowledges support from the Faraday Institution through the studentship (FITG028-B) and thanks Arron Bird for providing CVD carbon reference materials.

The authors acknowledge EPSRC funding through See More Make More: EP/V012762/1, EP/V011995/1, EP/V012037/1.

The authors acknowledge: use of characterisation facilities within the David Cockayne Centre for Electron Microscopy (DCCEM), Department of Materials, University of Oxford, alongside financial support provided by the Henry Royce Institute (Grant ref EP/R010145/1); use of facilities within the Loughborough Materials Characterisation Centre and for access to the Helios PFIB, funded by the EPSRC grant EP/P030599/1; access to the Helios Nanolab 650 in the Centre for High-Throughput Phenogenomics at the University of British Columbia, a facility supported by the Canada Foundation for Innovation, British Columbia Knowledge Development Foundation, and the UBC Faculty of Dentistry; Electron microscopy and analysis was performed in the Sorby Centre for Electron Microscopy at the University of Sheffield.

ZP, FM and TM acknowledge support from The Czech Academy of Sciences (project RVO:68081731 and Strategy AV21, Breakthrough future technologies), CF Electron microscopy and Raman spectroscopy (ISI CAS) supported by the Czech-BioImaging large RI project (LM2023050 funded by MEYS CR) for access to the Helios G4 HP (courtesy Thermo Fisher Scientific Brno).

AK, AT, SC and CR acknowledge the EPSRC grant EP/V007696/1, "Near-Field Optical Spectroscopy Centre at Sheffield, NOSC”.

CR, NTHF and FM acknowledge discussions enabled by FIT4NANO (CA19140) through FIT4NANO workshops.

The authors acknowledge Dr Benjamen Reed (National Physical Laboratory, U.K.) for the acquisition and analysis of the XPS data provided in this report, and for discussions and comments. The authors further acknowledge Dr Vivian Tong (National Physical Laboratory, U.K) for providing comments. These activities were supported by the National Measurement System of the UK Department of Science, Innovation and Technology.