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Dataset of figures presented in "Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymers" in Ultramicroscopy

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posted on 2016-10-04, 15:24 authored by Quan Wan, Robert Masters, David LidzeyDavid Lidzey, Kerry Abrams, Maurizio Dapor, Richard A Plenderleith, Stephen Rimmer, Frederik ClaeyssensFrederik Claeyssens, Cornelia RodenburgCornelia Rodenburg
This dataset includes the original data of the BSE simulation presented in the figures in the paper manuscript. The files are named after the material and the applied primary energy/deceleration voltage.

Funding

EPSRC EP/N008065/1.

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    Department of Materials Science and Engineering

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    Keywords

    Low-voltage scanning electron microscopyQuantitative back-scattered imagingpolymerConcentric back scattered detectorAngle selective SEMNanomaterials

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    CC BY 4.0

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