<strong>Dataset: A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing</strong>
dataset
posted on 2023-06-04, 13:01 authored by Nestor Sanchez ArriagaNestor Sanchez Arriaga, Divya TiwariDivya Tiwari, Windo Hutabarat, Adrian Leyland, Ashutosh TiwariAshutosh Tiwari<p>This data repository contains the following information related to the Article: "<strong>A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing"</strong></p>
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<p>File 1: RMSE and MSE calculation for SENSOR1</p>
<p>File 2: RMSE and MSE calculation for SENSOR2 </p>
<p>File 3: RMSE and MSE calculation for SENSOR2 using HAL/DEUT light source</p>
<p>File 4: Interference Interval Method Calculation and Reflectance Curve Modelling </p>
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Funding
EPSRC NetworkPlus In Digitalised Surface Manufacturing: Towards "World's Best" Processes
Engineering and Physical Sciences Research Council
Find out more...Intelligent engineering coatings for in-manufacture and in-service monitoring of critical safety products (CoatIN)
Engineering and Physical Sciences Research Council
Find out more...Consejo Nacional de Ciencia y Tecnología (CONACYT—México) (CVU: 1059795)
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Data description
- The file formats are open or commonly used
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- Headings and units are explained in the files
